TS1.2 | Deformation in detail: high-resolution imaging and textural analysis of Earth materials
EDI PICO
Deformation in detail: high-resolution imaging and textural analysis of Earth materials
Co-organized by EMRP1/GD7/GMPV2
Convener: Ismay Vénice AkkerECSECS | Co-conveners: Christoph Schrank, Rebecca KühnECSECS, Luiz F. G. Morales

Understanding rock deformation requires zooming into the finest details of mineral fabrics down to the nanoscale. Electron and X-ray microscopy performed with laboratory instruments or synchrotrons provides a wide range of imaging techniques in real space (e.g., micro-tomography, X-ray fluorescence microscopy, backscattered- and secondary-electron microscopy, ptychography) and reciprocal space (electron-backscatter diffraction, transmission micro-XRD, small-angle X-ray scattering). This session welcomes studies that use these cutting-edge analytical techniques to investigate strain localization, fluid–rock/mineral interactions, and the links between nano(geo)sciences- to regional-scale deformation across the Earth’s crust. We particularly encourage contributions that integrate such high-resolution datasets with natural observations, experimental techniques and numerical modelling.

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